Experimental characterization of two-axis MEMS scanners

نویسندگان

  • Jui-che Tsai
  • Tien-liang Hsieh
  • Chun-da Liao
  • Sheng-jie Chiou
  • Dooyoung Hah
  • Ming C Wu
چکیده

In this paper, we perform the experimental characterization of two-axis MEMS scanners driven by radial vertical combdrive actuators. The dc scan ranges are limited by the pull-in effect. Each scanner utilizes a cross-bar spring structure to achieve two rotational degrees of freedom (DOFs) without employing any gimbal. Both the actuators and torsion springs are hidden underneath the mirror to obtain a small form factor. The devices are fabricated by a five-layer polysilicon surface micromachining process (SUMMiT-V). Devices with different combinations of parameter values are experimentally characterized and compared. (Some figures in this article are in colour only in the electronic version)

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تاریخ انتشار 2009